Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (repost)

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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (repost)

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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Springer | 2009 | ISBN: 1441909370 | 171 pages | PDF | 3,8 MB

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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (repost)

under: Engineering and Technology, Home
Tags: 171-pages, advanced-test, detection, dynamic, dynamic-fault, effective, effective-solutions, isbn, methods, nanoscaled, pdf, springer

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