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		<title>Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (repost)</title>
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		<pubDate>Wed, 10 Feb 2010 04:14:33 +0000</pubDate>
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		<title>Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (repost)</title>
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		<pubDate>Wed, 10 Feb 2010 04:14:33 +0000</pubDate>
		<dc:creator>marrimus.org</dc:creator>
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